XRay – Failure Analysis

XRay – Failure Analysis

+
The X-Scope 1800 X-Ray Inspection System is an entry level machine with high level features.

Failure Analysis
+
The X-Scope 2000 X-Ray Inspection System is a full featured high-performance x-ray inspection instrument with an unbeatable price to performance ratio which includes all of the advanced features you would expect to find on a much more expensive x-ray inspection system.

Failure Analysis
+
The X-Scope 3000 X-Ray Inspection System is the latest addition to the X-Scope platform.

Failure Analysis
+
The X-Spection 6000 is our most Technologically Advanced X-Ray Inspection System. As with all X-SCOPE platforms, it includes every advanced s/w tool required for a wide variety of applications.

Failure Analysis
+
The AXI 7300 is our the most technologically advanced X-Ray Inspection System. As with all X-SCOPE platforms, it includes every advanced s/w tool required for a wide variety of applications.

Failure Analysis
+
Component connections on today’s compact and densely populated PCBs are hidden by other components, making X-ray the only viable inspection solution. XT V 160 is an easy-to-use, cost-effective and high-quality PCB inspection system targeting production facilities and failure analysis laboratories. In automated inspection mode, samples can be inspected at the highest throughput. In manual mode, intuitive software and high-precision sample manipulation enable operators to visualize and evaluate the tiniest internal defects and deficiencies.

Failure Analysis, Featured
+
MCT225 efficiently measures internal and external geometry without reference measurements and damaging the sample. With fifty years’ CMM experience and twenty five years’ X-ray experience, our pedigree for reliable high quality Metrology CT is second to none.

Failure Analysis
+
The XT H 450 sets a new reference for turbine blade measurement and NDT of small to medium castings. At the core of this powerful equipment is a 450kV micro-focus source, providing superior resolution and accuracy. The curved linear array detector optimizes the collection of X-rays by eliminating scatter phenomena that typically corrupt 2D radiographs of blades and other metal parts.

Failure Analysis
+
The XT H 320 features a more powerful microfocus X-ray source that is able to run highly accurate inspection on dense industrial objects. The system consists of a 320 kV microfocus source delivering up to 320 W of power. As the X-ray spot size of these sources is orders of magnitude smaller compared to minifocus sources, end users benefit from superior resolution, accuracy and a wider array of measurable parts.

Failure Analysis
+
Detailed capture and measurement of internal component and assembly features is often vital for quality control, failure analysis and material research. XT H 225 offers a powerful micro-focus X-ray source, a large inspection volume, and high X-ray and CT imaging resolution. XT H 225 suits a wide range of applications, including inspection of small castings, plastic parts as well as material research.

Failure Analysis